Journal article
Broadside and Functional Broadside Tests for Partial-Scan Circuits
IEEE transactions on very large scale integration (VLSI) systems, Vol.19(6), pp.1104-1108
2011
DOI: 10.1109/TVLSI.2010.2044049
Abstract
Functional broadside tests were defined to address overtesting that may occur due to the detection of delay faults under nonfunctional operation conditions. Such conditions are made possible by scanning in unreachable states. Functional broadside tests were defined and studied in the context of full-scan circuits. In this work, we study the definition of broadside and functional broadside tests in partial-scan circuits. A unique property we show is that if the unscanned state variables are observable (through the application of input sequences or through observation points), the fault coverage achievable with functional broadside tests is independent of the level of scan and the subset of scanned state variables. This implies that when functional broadside tests are used to avoid overtesting, using lower percentages of scanned state variables may be possible without reducing the fault coverage significantly. Experimental results support this point. © 2010 IEEE.
Details
- Title: Subtitle
- Broadside and Functional Broadside Tests for Partial-Scan Circuits
- Creators
- Irith Pomeranz - Purdue University West LafayetteSudhakar M Reddy - University of Iowa
- Resource Type
- Journal article
- Publication Details
- IEEE transactions on very large scale integration (VLSI) systems, Vol.19(6), pp.1104-1108
- DOI
- 10.1109/TVLSI.2010.2044049
- ISSN
- 1063-8210
- eISSN
- 1557-9999
- Publisher
- Institute of Electrical and Electronics Engineers
- Language
- English
- Date published
- 2011
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197338002771
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