Journal article
Characterization of Choroidal Layers in Normal Aging Eyes Using Enface Swept-Source Optical Coherence Tomography
PloS one, Vol.10(7), pp.e0133080-e0133080
2015
DOI: 10.1371/journal.pone.0133080
PMCID: PMC4501794
PMID: 26172550
Abstract
To characterize qualitative and quantitative features of the choroid in normal eyes using enface swept-source optical coherence tomography (SS-OCT). Fifty-two eyes of 26 consecutive normal subjects were prospectively recruited to obtain multiple three-dimensional 12 x 12 mm volumetric scans using a long-wavelength high-speed SS-OCT prototype. A motion-correction algorithm merged multiple SS-OCT volumes to improve signal. Retinal pigment epithelium (RPE) was segmented as the reference and enface images were extracted at varying depths every 4.13 μm intervals. Systematic analysis of the choroid at different depths was performed to qualitatively assess the morphology of the choroid and quantify the absolute thicknesses as well as the relative thicknesses of the choroidal vascular layers including the choroidal microvasculature (choriocapillaris, terminal arterioles and venules; CC) and choroidal vessels (CV) with respect to the subfoveal total choroidal thickness (TC). Subjects were divided into two age groups: younger (<40 years) and older (≥ 40 years). Mean age of subjects was 41.92 (24-66) years. Enface images at the level of the RPE, CC, CV, and choroidal-scleral interface were used to assess specific qualitative features. In the younger age group, the mean absolute thicknesses were: TC 379.4 μm (SD ± 75.7 μm), CC 81.3 μm (SD ± 21.2 μm) and CV 298.1 μm (SD ± 63.7 μm). In the older group, the mean absolute thicknesses were: TC 305.0 μm (SD ± 50.9 μm), CC 56.4μm (SD ± 12.1 μm) and CV 248.6μm (SD ± 49.7 μm). In the younger group, the relative thicknesses of the individual choroidal layers were: CC 21.5% (SD ± 4.0%) and CV 78.4% (SD ± 4.0%). In the older group, the relative thicknesses were: CC 18.9% (SD ± 4.5%) and CV 81.1% (SD ± 4.5%). The absolute thicknesses were smaller in the older age group for all choroidal layers (TC p=0.006, CC p=0.0003, CV p=0.03) while the relative thickness was smaller only for the CC (p=0.04). Enface SS-OCT at 1050 nm enables a precise qualitative and quantitative characterization of the individual choroidal layers in normal eyes. Only the CC is relatively thinner in the older eyes. In-vivo evaluation of the choroid at variable depths may be potentially valuable in understanding the natural history of age-related posterior segment disease.
Details
- Title: Subtitle
- Characterization of Choroidal Layers in Normal Aging Eyes Using Enface Swept-Source Optical Coherence Tomography
- Creators
- Mehreen Adhi - Department of Ophthalmology, New England Eye Center, Tufts Medical Center, Boston, Massachusetts, United States of America; Department of Electrical Engineering and Computer Science and Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, Massachusetts, United States of AmericaDaniela Ferrara - Department of Ophthalmology, New England Eye Center, Tufts Medical Center, Boston, Massachusetts, United States of AmericaRobert F Mullins - Department of Ophthalmology and Visual Sciences, University of Iowa, Iowa City, Iowa, United States of AmericaCaroline R Baumal - Department of Ophthalmology, New England Eye Center, Tufts Medical Center, Boston, Massachusetts, United States of AmericaKathrin J Mohler - Department of Electrical Engineering and Computer Science and Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, Massachusetts, United States of America; Faculty of Physics, Ludwig-Maximilians-University Munich, Munich, GermanyMartin F Kraus - Department of Electrical Engineering and Computer Science and Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, Massachusetts, United States of America; Pattern Recognition Lab and Graduate School in Advanced Optical Technologies, University Erlangen-Nuremburg, Erlangen-Nuremburg, GermanyJonathan Liu - Department of Electrical Engineering and Computer Science and Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, Massachusetts, United States of AmericaEmmerson Badaro - Department of Ophthalmology, New England Eye Center, Tufts Medical Center, Boston, Massachusetts, United States of AmericaTarek Alasil - Department of Ophthalmology, New England Eye Center, Tufts Medical Center, Boston, Massachusetts, United States of AmericaJoachim Hornegger - Pattern Recognition Lab and Graduate School in Advanced Optical Technologies, University Erlangen-Nuremburg, Erlangen-Nuremburg, GermanyJames G Fujimoto - Department of Electrical Engineering and Computer Science and Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, Massachusetts, United States of AmericaJay S Duker - Department of Ophthalmology, New England Eye Center, Tufts Medical Center, Boston, Massachusetts, United States of AmericaNadia K Waheed - Department of Ophthalmology, New England Eye Center, Tufts Medical Center, Boston, Massachusetts, United States of America
- Resource Type
- Journal article
- Publication Details
- PloS one, Vol.10(7), pp.e0133080-e0133080
- DOI
- 10.1371/journal.pone.0133080
- PMID
- 26172550
- PMCID
- PMC4501794
- NLM abbreviation
- PLoS One
- ISSN
- 1932-6203
- eISSN
- 1932-6203
- Publisher
- United States
- Grant note
- R01-CA075289-16 / NCI NIH HHS R44EY022864-01 / NEI NIH HHS R01-EY011289-27 / NEI NIH HHS R44 EY022864 / NEI NIH HHS R01 EY011289 / NEI NIH HHS
- Language
- English
- Date published
- 2015
- Academic Unit
- Ophthalmology and Visual Sciences
- Record Identifier
- 9983980093102771
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