Journal article
Classification of faults in synchronous sequential circuits
IEEE transactions on computers, Vol.42(9), pp.1066-1077
09/1993
DOI: 10.1109/12.241596
Abstract
Undetectable and redundant faults in synchronous sequential circuits are analyzed. A distinction is drawn between undetectable faults and faults that are never manifested as output errors. The latter are classified as redundant. It is shown that there are faults for which a test sequence does not exist; however, under certain initial conditions (or initial states) of the circuit, faulty behavior may be observed. Such faults are called partially detectable faults. A partially detectable fault is undetectable, but is not redundant, as it affects circuit operation under some conditions. The author observes that the notion of redundancy cannot be separated from the mode of operation of the circuit. Two modes of operation are considered, representative of common modes, called the synchronization mode and the free mode. Accordingly, the identification of redundant faults calls for different test generation strategies. Two test strategies to generate tests for detectable faults and partial tests for partially detectable faults are defined, called the restricted test strategy and the unrestricted test strategy.< >
Details
- Title: Subtitle
- Classification of faults in synchronous sequential circuits
- Creators
- I Pomeranz - University of IowaS.M Reddy - University of Iowa
- Resource Type
- Journal article
- Publication Details
- IEEE transactions on computers, Vol.42(9), pp.1066-1077
- Publisher
- IEEE
- DOI
- 10.1109/12.241596
- ISSN
- 0018-9340
- eISSN
- 1557-9956
- Language
- English
- Date published
- 09/1993
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197200702771
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