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Core-state manipulation of single Fe impurities in GaAs with a scanning tunneling microscope
Journal article   Open access   Peer reviewed

Core-state manipulation of single Fe impurities in GaAs with a scanning tunneling microscope

J Bocquel, V. R Kortan, C Şahin, R. P Campion, B. L Gallagher, M. E Flatté and P. M Koenraad
Physical review. B, Condensed matter and materials physics, Vol.87(7), 075421
02/2013
DOI: 10.1103/PhysRevB.87.075421
url
https://doi.org/10.1103/PhysRevB.87.075421View
Published (Version of record) Open Access

Abstract

We demonstrate that a scanning tunneling microscope tip can be used to manipulate the tightly bound core (d-electron) state of single Fe ions embedded in GaAs. Increasing tip-sample voltage removes one d electron from the core of a single Fe, changing the dopant from the (Fe2+)- ionized acceptor state to the (Fe3+)0 isoelectronic state, which alters the spin moment and dramatically modifies the measured local electronic contrast in topographic maps of the surface. Evidence of internal transitions among the d states of the Fe core is also seen in topographic maps where dark anisotropic features emerge from the interference between two paths: the direct tip-sample tunneling and tunneling which excites a d-state core exciton of the Fe dopant. © 2013 American Physical Society.

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