Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air

S. Ghosh; J. Haefner; J. Martin-Albo; R. Guenette; X. Li; A. A. Loya Villalpando; C. Burch; C. Adams; V. Álvarez; L. Arazi; I. J. Arnquist; C. D. R. Azevedo; K. Bailey; F. Ballester; J. M. Benlloch-Rodriguez; F. I. G. M. Borges; N. Byrnes; S. Carcel; J. Carrion; S. Cebrian; E. Church; C. A. N. Conde; T. Contreras; G. Diaz; J. Diaz; M. Diesburg; J. Escada; R. Esteve; R. Felkai; A. F. M. Fernandes; L. M. P. Fernandes; P. Ferrario; A. L. Ferreira; E. D. C. Freitas; A. Goldschmidt; J. J. Gomez-Cadenas; D. Gonzalez-Diaz; R. M. Gutierrez; K. Hafidi; J. Hauptman; C. A. O. Henriques; J. A. Hernando Morata; P. Herrero; V. Herrero; Y. Ifergan; B. J. P. Jones; M. Kekic; L. Labarga; A. Laing; P. Lebrun; N. Lopez-March; M. Losada; R. D. P. Mano; A. Martinez; M. Martinez-Vara; G. Martinez-Lema; A. D. McDonald; F. Monrabal; C. M. B. Monteiro; F. J. Mora; J. Munoz Vidal; P. Novella; D. R. Nygren; B. Palmeiro; A. Para; J. Perez; M. Querol; A. Redwine; J. Renner; J. Repond; S. Riordan; L. Ripoll; Y. Rodríguez García; J. Rodriguez; L. Rogers; B. Romeo; C. Romo-Luque; F. P. Santos; J. M. F. dos Santos; A. Simon; M. Sorel; T. Stiegler; J. F. Toledo; J. Torrent; A. Uson; J. F. C. A. Veloso; R. Webb; R. Weiss-Babai; J. T. White; K. Woodruff; N. Yahlali

doi:10.1088/1748-0221/15/11/P11031

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Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air

Journal article

Peer reviewed

Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air

S. Ghosh, J. Haefner, J. Martin-Albo, R. Guenette, X. Li, A. A. Loya Villalpando, C. Burch, C. Adams, V. Álvarez, L. Arazi, …

Journal of instrumentation, Vol.15(11), pp.P11031-P11031

11/01/2020

DOI: 10.1088/1748-0221/15/11/P11031

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Abstract

Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. However, the reflectance of PTFE is a function of its thickness. In this work, we investigate this dependence in air for light of wavelengths 260 nm and 450 nm using two complementary methods. We find that PTFE reflectance for thicknesses from 5 mm to 10 mm ranges from 92.5% to 94.5% at 450 nm, and from 90.0% to 92.0% at 260 nm We also see that the reflectance of PIFE of a given thickness can vary by as much as 2.7% within the same piece of material. Finally, we show that placing a specular reflector behind the PTFE can recover the loss of reflectance in the visible without introducing a specular component in the reflectance.

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Instruments & Instrumentation

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Title: Subtitle: Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air
Creators: S. Ghosh - Harvard University
J. Haefner - Harvard University
J. Martin-Albo - Harvard University
R. Guenette - Harvard University
X. Li - Harvard University
A. A. Loya Villalpando - Harvard University
C. Burch - Harvard University
C. Adams - Argonne National Laboratory
V. Álvarez - Universitat Politècnica de València
L. Arazi - Ben-Gurion University of the Negev
I. J. Arnquist - Pacific Northwest National Laboratory
C. D. R. Azevedo - University of Aveiro
K. Bailey - Argonne National Laboratory
F. Ballester - Instituto de Instrumentación para Imagen Molecular
J. M. Benlloch-Rodriguez - Donostia International Physics Center
F. I. G. M. Borges - University of Coimbra
N. Byrnes - The University of Texas at Arlington
S. Carcel - Instituto de Física Corpuscular
J. Carrion - Instituto de Física Corpuscular
S. Cebrian - Universidad de Zaragoza
E. Church - Pacific Northwest National Laboratory
C. A. N. Conde - University of Coimbra
T. Contreras - Harvard University
G. Diaz - Instituto de Física Corpuscular
J. Diaz - Instituto de Física Corpuscular
M. Diesburg - Fermi National Accelerator Laboratory
J. Escada - University of Coimbra
R. Esteve - Instituto de Instrumentación para Imagen Molecular
R. Felkai - Instituto de Física Corpuscular
A. F. M. Fernandes - University of Coimbra
L. M. P. Fernandes - University of Coimbra
P. Ferrario - Ikerbasque
A. L. Ferreira - University of Aveiro
E. D. C. Freitas - University of Coimbra
A. Goldschmidt - Lawrence Berkeley National Laboratory
J. J. Gomez-Cadenas - Ikerbasque
D. Gonzalez-Diaz - Universidade de Santiago de Compostela
R. M. Gutierrez - Universidad Antonio Nariño
K. Hafidi - Argonne National Laboratory
J. Hauptman - Iowa State University
C. A. O. Henriques - University of Coimbra
J. A. Hernando Morata - Universidade de Santiago de Compostela
P. Herrero - Donostia International Physics Center
V. Herrero - Universitat Politècnica de València
Y. Ifergan - Ben-Gurion University of the Negev
B. J. P. Jones - Univ Texas Arlington, Dept Phys, Arlington, TX 76019 USA
M. Kekic - Universidade de Santiago de Compostela
L. Labarga - Universidad Autónoma de Madrid
A. Laing - The University of Texas at Arlington
P. Lebrun - Fermi National Accelerator Laboratory
N. Lopez-March - Instituto de Física Corpuscular
M. Losada - Universidad Antonio Nariño
R. D. P. Mano - University of Coimbra
A. Martinez - Donostia International Physics Center
M. Martinez-Vara - Instituto de Física Corpuscular
G. Martinez-Lema - Instituto de Física Corpuscular
A. D. McDonald - The University of Texas at Arlington
F. Monrabal - Donostia International Physics Center
C. M. B. Monteiro - University of Coimbra
F. J. Mora - Instituto de Instrumentación para Imagen Molecular
J. Munoz Vidal - Instituto de Física Corpuscular
P. Novella - Instituto de Física Corpuscular
D. R. Nygren - The University of Texas at Arlington
B. Palmeiro - Instituto de Física Corpuscular
A. Para - Fermi National Accelerator Laboratory
J. Perez - Canfranc Underground Laboratory
M. Querol - Instituto de Física Corpuscular
A. Redwine - Ben-Gurion University of the Negev
J. Renner - Universidade de Santiago de Compostela
J. Repond - Argonne National Laboratory
S. Riordan - Argonne National Laboratory
L. Ripoll - Universitat de Girona
Y. Rodríguez García - Universidad Antonio Nariño
J. Rodriguez - Instituto de Instrumentación para Imagen Molecular
L. Rogers - The University of Texas at Arlington
B. Romeo - Donostia International Physics Center
C. Romo-Luque - Instituto de Física Corpuscular
F. P. Santos - University of Coimbra
J. M. F. dos Santos - University of Coimbra
A. Simon - Ben-Gurion University of the Negev
M. Sorel - Instituto de Física Corpuscular
T. Stiegler - Texas A&M University
J. F. Toledo - Instituto de Instrumentación para Imagen Molecular
J. Torrent - Donostia International Physics Center
A. Uson - Instituto de Física Corpuscular
J. F. C. A. Veloso - University of Aveiro
R. Webb - Texas A&M University
R. Weiss-Babai - Ben-Gurion University of the Negev
J. T. White - Texas A&M University
K. Woodruff - The University of Texas at Arlington
N. Yahlali - Instituto de Física Corpuscular
Resource Type: Journal article
Publication Details: Journal of instrumentation, Vol.15(11), pp.P11031-P11031
DOI: 10.1088/1748-0221/15/11/P11031
ISSN: 1748-0221
eISSN: 1748-0221
Publisher: Iop Publishing Ltd
Number of pages: 16
Grant note: 339787-NEXT / European Research Council (ERC); Spanish Government 674896; 690575; 740055 / European Union; European Union (EU) DE-AC0207CH11359; DE-FG02-13ER42020; DE-SC0019223/DE-SC0019054; DE-AC02-06CH11357 / U.S. Department of Energy; United States Department of Energy (DOE) PTDC/FIS-NUC/2525/2014 / Fundao para a Cincia e a Tecnologia; Fundacao para a Ciencia e a Tecnologia (FCT) 100010434; LCF/BQ/PI19/11690012 / Fundacion Bancaria "la Caixa"; La Caixa Foundation University of Texas at Arlington (USA) FIS2014-53371-C04; RTI2018-095979; SEV-2014-0398; CEX2018-000867-S; MDM-2016-0692 / Ministerio de Economia y Competitividad of Spain; Spanish Government FIS2014-53371-C04; RTI2018-095979; SEV-2014-0398; CEX2018-000867-S; MDM-2016-0692 / Ministerio de Ciencia, Innovacion y Universidades of Spain; Spanish Government PROMETEO/2016/120; SEJI/2017/011 / Generalitat Valenciana; Center for Forestry Research & Experimentation (CIEF) PTDC/FIS-NUC/2525/2014; UID/04559/2020 / Portuguese FCT; Fundacao para a Ciencia e a Tecnologia (FCT) RYC2015-18820 / Ramon y Cajal program (Spain); Spanish Government
Language: English
Date published: 11/01/2020
Academic Unit: Physics and Astronomy
Record Identifier: 9984627217802771

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