Journal article
Detecting FET Stuck-Open Faults in CMOS Latches And Flip-Flops
IEEE design & test of computers, Vol.3(5), pp.17-26
10/1986
DOI: 10.1109/MDT.1986.295040
Abstract
The authors present evidence that conventional tests cannot detect FET stuck-open faults in several CMOS latches and flip-flops. Examples are given to show that stuck-open faults can change static latches and flip-flops into dynamic devices-a danger to circuits whose operation requires static memory, since undetected FET stuck-open faults can cause malfunctions. Designs are given for several memory devices in which all single FET stuck-open faults are detectable. These memory devices include common latches, master-slave flip-flops, and scan-path flip-flops that can be used in applications requiring static memory elements whose operation can be reliably ascertained through conventional fault testing methods.
Details
- Title: Subtitle
- Detecting FET Stuck-Open Faults in CMOS Latches And Flip-Flops
- Creators
- Madhukar K Reddy - University of IowaSudhakar M Reddy - University of Iowa
- Resource Type
- Journal article
- Publication Details
- IEEE design & test of computers, Vol.3(5), pp.17-26
- Publisher
- IEEE Computer Society
- DOI
- 10.1109/MDT.1986.295040
- ISSN
- 0740-7475
- eISSN
- 1558-1918
- Language
- English
- Date published
- 10/1986
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197424502771
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