Journal article
Diagnosis of path delay faults based on low-coverage tests
IET computers & digital techniques, Vol.4(2), pp.89-103
2010
DOI: 10.1049/iet-cdt.2008.0154
Abstract
Fault diagnosis processes consider the fact that a circuit fails a test as carrying more information than if the circuit passes a test. As a result, tests that detect smaller numbers of faults are likely to result in more accurate fault diagnosis. We study the existence of low-coverage tests, which detect small numbers of faults, for stuck-at faults, transition faults and path delay faults. The study shows that such tests are prevalent for path delay faults. We discuss the use of low-coverage tests for diagnosis of path delay faults, and describe a procedure for generating low-coverage tests for path delay faults. © 2010 © The Institution of Engineering and Technology.
Details
- Title: Subtitle
- Diagnosis of path delay faults based on low-coverage tests
- Creators
- I Pomeranz - Purdue University West LafayetteS. M Reddy - University of Iowa
- Resource Type
- Journal article
- Publication Details
- IET computers & digital techniques, Vol.4(2), pp.89-103
- DOI
- 10.1049/iet-cdt.2008.0154
- ISSN
- 1751-8601
- eISSN
- 1751-861X
- Publisher
- Institution of Engineering and Technology
- Language
- English
- Date published
- 2010
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197226002771
Metrics
11 Record Views