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Dynamic Atomic Column Detection in Transmission Electron Microscopy Videos via Ridge Estimation
Journal article   Peer reviewed

Dynamic Atomic Column Detection in Transmission Electron Microscopy Videos via Ridge Estimation

Yuchen Xu, Andrew M. Thomas, Peter A. Crozier and David S. Matteson
IEEE transactions on image processing, Vol.34, pp.1588-1601
2025
DOI: 10.1109/TIP.2025.3543138
PMID: 40031631

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Abstract

Microscopy Atomic measurements Atoms Electrons Feature extraction functional data Heuristic algorithms image processing nanoparticle object recognition ridge detection Signal to noise ratio Trajectory Transmission electron microscopy transmission electron microscopy (TEM) Videos

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