Journal article
Electromechanical Properties of Self-Assembled Monolayers of Tetrathiafulvalene Derivatives Studied by Conducting Probe Atomic Force Microscopy
Journal of physical chemistry. C, Vol.114(10), pp.4429-4435
03/18/2010
DOI: 10.1021/jp9073834
Abstract
The electrical conduction of metal−molecule−metal junctions formed between Au-supported self-assembled monolayers (SAMs) of symmetric tetrathiafulvalene (TTF) derivatives and a Pt-coated atomic force microscope (AFM) tip has been measured under different compression forces using conducting probe AFM. The TTFs are linked to the metal through double metal−thiol linkers on both sides of the molecule. The TTF junctions exhibit remarkably high electrical conduction with estimated single molecule resistance of 14.7 ± 3.4 GΩ, corresponding to the molecular resistivity of 390 Ω·cm. A single molecule resistance of a comparable length 1-decanethiol molecule is estimated to be several orders of magnitude higher with the value of 950 ± 22 GΩ. The TTF junction resistance displayed a unique nonlinear dependence with the compression force. The dependence is attributed to the change in the intermolecular electronic coupling between the TTF molecules.
Details
- Title: Subtitle
- Electromechanical Properties of Self-Assembled Monolayers of Tetrathiafulvalene Derivatives Studied by Conducting Probe Atomic Force Microscopy
- Creators
- Lindsay R DitzlerChandana KarunatilakaVenkat R DonuruHaiying Y LiuAlexei V Tivanski
- Resource Type
- Journal article
- Publication Details
- Journal of physical chemistry. C, Vol.114(10), pp.4429-4435
- DOI
- 10.1021/jp9073834
- NLM abbreviation
- J Phys Chem C Nanomater Interfaces
- ISSN
- 1932-7447
- eISSN
- 1932-7455
- Publisher
- American Chemical Society
- Alternative title
- SAMs of Tetrathiafulvalene Derivatives
- Language
- English
- Date published
- 03/18/2010
- Academic Unit
- Chemistry
- Record Identifier
- 9983985950602771
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