Journal article
Embedded totally self-checking checkers: a practical design
IEEE design & test of computers, Vol.7(4), pp.5-12
08/1990
DOI: 10.1109/54.57909
Abstract
In a totally self-checking (TSC) design, the circuit detects errors by monitoring redundantly coded data/control paths through a TSC checker. A problem arises when not all these code words are on the monitored lines during normal operation. A method of designing checkers that solves this difficulty is proposed. The method uses TSC checkers based on flip-flops instead of using the mostly combinational checkers now available. Two design applications are presented: TSC checkers for arithmetic AN codes, and a TSC iterative logic array.< >
Details
- Title: Subtitle
- Embedded totally self-checking checkers: a practical design
- Creators
- Sandip Kundu - IBMSudhakar M Reddy
- Resource Type
- Journal article
- Publication Details
- IEEE design & test of computers, Vol.7(4), pp.5-12
- Publisher
- IEEE Computer Society
- DOI
- 10.1109/54.57909
- ISSN
- 0740-7475
- eISSN
- 1558-1918
- Language
- English
- Date published
- 08/1990
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197236202771
Metrics
11 Record Views