Journal article
Enumeration of test sequences in increasing chronological order to improve the levels of compaction achieved by vector omission
IEEE transactions on computers, Vol.51(7), pp.866-872
07/2002
DOI: 10.1109/TC.2002.1017705
Abstract
We describe a method to improve the levels of compaction achievable by static compaction procedures based on vector omission. Such procedures are used to reduce the lengths of test sequences for synchronous sequential circuits without reducing the fault coverage. The proposed procedure enumerates, in increasing chronological order, test sequences consisting of subsets of the vectors included in a given test sequence that needs to be compacted. The unique feature of this approach is that test vectors omitted from the test sequence at an earlier iteration can be reintroduced at a later iteration. This results in a less greedy procedure and helps reduce the compacted test sequence length beyond the length that can be achieved if vectors are omitted permanently as in earlier procedures.
Details
- Title: Subtitle
- Enumeration of test sequences in increasing chronological order to improve the levels of compaction achieved by vector omission
- Creators
- Irith Pomeranz - Purdue University West LafayetteSudhakar M Reddy - University of Iowa
- Resource Type
- Journal article
- Publication Details
- IEEE transactions on computers, Vol.51(7), pp.866-872
- DOI
- 10.1109/TC.2002.1017705
- ISSN
- 0018-9340
- eISSN
- 1557-9956
- Publisher
- IEEE
- Language
- English
- Date published
- 07/2002
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197529002771
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