Journal article
Exact computation of maximally dominating faults and its application to n-detection tests for full-scan circuits
IEE proceedings. Computers and digital techniques, Vol.151(3), pp.235-244
2004
DOI: 10.1049/ip-cdt:20040141
Abstract
The size of an n-detection test set increases approximately linearly with n. This increase in size may be too fast when an upper bound on test set size must be satisfied. A test generation method is proposed for obtaining a more gradual increase in the sizes of n-detection test sets, while still ensuring that every additional test would be useful in improving the test quality. The method is based on the use of fault-dominance relations to identify a small subset of faults (called maximally dominating faults) whose numbers of detections are likely to have a high impact on the defect coverage of the test set. Structural analysis obtains a superset of the maximally dominating fault set. A method is proposed for determining exact sets of maximally dominating faults. New types of n-detection test sets are based on the approximate and exact sets of maximally dominating faults. The test sets are called (n, n2)-detection test sets and (n, n2, n3)-detection test sets. Experimental results demonstrate the usefulness of these test sets in producing high-quality n-detection test sets for the combinational logic of ISCAS-89 benchmark circuits.
Details
- Title: Subtitle
- Exact computation of maximally dominating faults and its application to n-detection tests for full-scan circuits
- Creators
- I Polian - University of FreiburgI Pomeranz - Purdue University West LafayetteS. M Reddy - University of IowaB Becker - Albert-Ludwigs-University. Georges-Köhler-Allee 51, 79110 Freiburg i. Br., Germany
- Resource Type
- Journal article
- Publication Details
- IEE proceedings. Computers and digital techniques, Vol.151(3), pp.235-244
- DOI
- 10.1049/ip-cdt:20040141
- ISSN
- 1350-2387
- eISSN
- 1359-7027
- Publisher
- Institution of Electrical Engineers
- Language
- English
- Date published
- 2004
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197238502771
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