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Expanding Bifactor Models of Psychological Traits to Account for Multiple Sources of Measurement Error
Journal article   Peer reviewed

Expanding Bifactor Models of Psychological Traits to Account for Multiple Sources of Measurement Error

Walter P. Vispoel, Hyeryung Lee, Guanlan Xu and Hyeri Hong
Psychological assessment, Vol.34(12), pp.1093-1111
12/2022
DOI: 10.1037/pas0001170
PMID: 36265049

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Abstract

Psychology Psychology, Clinical Social Sciences

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