Extracting double layer charge density distributions using the method of moments

K.E Lonngren; P.V Schwartz; Er Wei Bai; W.C Theisen; R.L Merlino; R.T Carpenter

doi:10.1109/27.297880

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Journal article

Extracting double layer charge density distributions using the method of moments

K.E Lonngren, P.V Schwartz, Er Wei Bai, W.C Theisen, R.L Merlino and R.T Carpenter

IEEE transactions on plasma science, Vol.22(3), pp.278-280

06/1994

DOI: 10.1109/27.297880

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Abstract

Using the method of moments, it is shown that the charge distribution can be directly extracted from a measured potential profile. The technique is described and placed on a theoretical foundation. The predicted charge distribution for a potential profile V=V/sub 0/ tanh (x/L) using this technique is compared with a direct solution of Poisson's equation. It is shown that similar results are obtained even if random noise is present in the system.< >

Charge measurement

Current measurement

Extraterrestrial measurements

Laboratories

Moment methods

Plasma density

Plasma diagnostics

Plasma temperature

Poisson equations

Probes

Details

Title: Subtitle: Extracting double layer charge density distributions using the method of moments
Creators: K.E Lonngren - University of Iowa
P.V Schwartz - University of Iowa
Er Wei Bai - University of Iowa
W.C Theisen
R.L Merlino
R.T Carpenter
Resource Type: Journal article
Publication Details: IEEE transactions on plasma science, Vol.22(3), pp.278-280
Publisher: IEEE
DOI: 10.1109/27.297880
ISSN: 0093-3813
eISSN: 1939-9375
Language: English
Date published: 06/1994
Academic Unit: Physics and Astronomy; Electrical and Computer Engineering
Record Identifier: 9984197337702771

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