Logo image
IRO Home Research units Researcher Profiles
Sign in
Feature Detection and Hypothesis Testing for Extremely Noisy Nanoparticle Images using Topological Data Analysis
Journal article   Peer reviewed

Feature Detection and Hypothesis Testing for Extremely Noisy Nanoparticle Images using Topological Data Analysis

Andrew M. Thomas, Peter A. Crozier, Yuchen Xu and David S. Matteson
Technometrics, Vol.65(4), pp.590-603
2023
DOI: 10.1080/00401706.2023.2203744

View Online

Abstract

ALPS statistic Catalysis Cubical persistent homology Multiple Monte Carlo testing Persistent entropy Transmission electron microscopy

Details

Logo image