Finite memory test response compactors for embedded test applications

Janusz Rajski; Jerzy Tyszer; Chen Wang; Sudhakar M Reddy

doi:10.1109/TCAD.2005.844111

Back

Finite memory test response compactors for embedded test applications

Journal article

Peer reviewed

Finite memory test response compactors for embedded test applications

Janusz Rajski, Jerzy Tyszer, Chen Wang and Sudhakar M Reddy

IEEE transactions on computer-aided design of integrated circuits and systems, Vol.24(4), pp.622-634

04/01/2005

DOI: 10.1109/TCAD.2005.844111

View Online

Abstract

A new class of finite memory compaction schemes called convolutional compactors (CCs) is introduced. The CCs can also be used to enhance conventional multiple input signature registers. The experimental results demonstrate the efficiency of convolutional compaction for several industrial circuits.

Analysis

Circuit design

Design and construction

Embedded systems

Memory compaction

Memory management

Memory mapping

Memory partitioning

Memory protection

Memory refresh (Computers)

Details

Title: Subtitle: Finite memory test response compactors for embedded test applications
Creators: Janusz Rajski - Mentor Graphics
Jerzy Tyszer - Poznań University of Technology
Chen Wang - Mentor Graphics
Sudhakar M Reddy - University of Iowa
Resource Type: Journal article
Publication Details: IEEE transactions on computer-aided design of integrated circuits and systems, Vol.24(4), pp.622-634
DOI: 10.1109/TCAD.2005.844111
ISSN: 0278-0070
eISSN: 1937-4151
Publisher: Institute of Electrical and Electronics Engineers, Inc
Language: English
Date published: 04/01/2005
Description audience: Trade; Academic
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197417602771

Metrics

18 Record Views

54 Times Cited - Web of Science

See more details