Journal article
Focused ion beam in dental research
American journal of dentistry, Vol.13(Spec No), pp.31D-34D
11/01/2000
PMID: 11763915
Abstract
Focused ion beam (FIB) has been available for over 10 yrs but until recently its usage has been confined to the semiconductor industry. It has been developed as an important tool in defect analysis, circuit modification and recently transmission electron microscope sample preparation. This paper introduces FIB and demonstrates its application in dental research. Its ion and electron imaging modes complement the SEM while its ability to prepare TEM samples from a wide range of material will allow the study of new types of adhesive interface. As an example, its use is described in the characterization of the interface of resin to a tribochemically treated surface of an experimental fiber-reinforced resin-based composite. As with all new techniques, the initial learning curve was difficult to manage. This new instrument offers opportunities to expand research in dental materials to areas not possible before.
Details
- Title: Subtitle
- Focused ion beam in dental research
- Creators
- H NgoJ CairneyP MunroeM VargasG Mount
- Resource Type
- Journal article
- Publication Details
- American journal of dentistry, Vol.13(Spec No), pp.31D-34D
- Publisher
- Mosher & Linder, Inc
- PMID
- 11763915
- ISSN
- 0894-8275
- Number of pages
- 4
- Language
- English
- Date published
- 11/01/2000
- Academic Unit
- Family Dentistry
- Record Identifier
- 9984367627502771
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