Journal article
Forward-looking fault simulation for improved static compaction
IEEE transactions on computer-aided design of integrated circuits and systems, Vol.20(10), pp.1262-1265
10/2001
DOI: 10.1109/43.952743
Abstract
Fault simulation of a test set in an order different from the order of generation (e.g., reverse- or random-order fault simulation) is used as a fast and effective method to drop unnecessary tests from a test set in order to reduce its size. We propose an improvement to this type of fault simulation process that makes it even more effective in reducing the test-set size. The proposed improvement allows us to drop tests without simulating them based on the fact that the faults they detect will be detected by tests that will be simulated later, hence the name of the improved procedure: forward-looking fault simulation. We present experimental results to demonstrate the effectiveness of the proposed improvement.
Details
- Title: Subtitle
- Forward-looking fault simulation for improved static compaction
- Creators
- Irith Pomeranz - Purdue University West LafayetteSudhakar M Reddy - University of Iowa
- Resource Type
- Journal article
- Publication Details
- IEEE transactions on computer-aided design of integrated circuits and systems, Vol.20(10), pp.1262-1265
- DOI
- 10.1109/43.952743
- ISSN
- 0278-0070
- eISSN
- 1937-4151
- Publisher
- IEEE
- Language
- English
- Date published
- 10/2001
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197194402771
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