Journal article
Functional Broadside Tests with Minimum and Maximum Switching Activity
Journal of low-power electronics, Vol.4(3), pp.429-437
2008
DOI: 10.1166/jolpe.2008.196
Abstract
Functional broadside tests were defined as broadside tests that detect target faults using only states that the circuit can visit during functional operation. With functional broadside tests, the peak switching activity and current demands during fast capture cycles can be guaranteed not to exceed those of functional operation, avoiding overtesting due to current demands that cannot be met. Therefore, functional broadside tests make it possible to explore tests with different switching activities as a way to maximize defect detection. For example, a test with a higher switching activity exercises more circuit lines, and is thus likely to activate and detect more defects. In addition, the maximum switching activity under functional broadside tests can be used as an upper bound on the switching activity that can be allowed for other types of tests. Tests with low switching activity may be preferred during wafer testing. Motivated by these applications, we study the range of switching activity possible for the functional broadside tests that detect a target fault, considering transition faults. We use the results to evaluate (low-power) standard broadside test sets. Copyright © 2008 American Scientific Publishers.
Details
- Title: Subtitle
- Functional Broadside Tests with Minimum and Maximum Switching Activity
- Creators
- Irith Pomeranz - Purdue University West LafayetteSudhakar M Reddy - University of Iowa
- Resource Type
- Journal article
- Publication Details
- Journal of low-power electronics, Vol.4(3), pp.429-437
- DOI
- 10.1166/jolpe.2008.196
- ISSN
- 1546-1998
- eISSN
- 1546-2005
- Publisher
- American Scientific Publishers
- Language
- English
- Date published
- 2008
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197268602771
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