Journal article
Generation of Functional Broadside Tests for Transition Faults
IEEE transactions on computer-aided design of integrated circuits and systems, Vol.25(10), pp.2207-2218
10/2006
DOI: 10.1109/TCAD.2005.860959
Abstract
Scan design allows a circuit to be tested using states that the circuit cannot enter during functional operation. It was observed that nonfunctional operation during testing may cause excessive currents that can cause a good chip to fail the test because of voltage droops caused by the excessive current demand. A good chip may also fail due to the propagation of signal transitions along nonfunctional long paths, especially during at-speed testing. This problem is studied in this paper in the context of tests for transition faults. A method for determining transition faults that are untestable under functional operation-conditions is described. Two procedures for generating transition-fault tests that use only functional operation conditions are also described. The first procedure accepts as input a broadside test set for transition faults. The second procedure accepts as input a test sequence for the nonscan circuit. Although such a test sequence is more complex to generate and simulate, it results in higher numbers of faults detected under functional operation conditions
Details
- Title: Subtitle
- Generation of Functional Broadside Tests for Transition Faults
- Creators
- Irith Pomeranz - Purdue University West LafayetteSudhakar M Reddy - University of Iowa
- Resource Type
- Journal article
- Publication Details
- IEEE transactions on computer-aided design of integrated circuits and systems, Vol.25(10), pp.2207-2218
- DOI
- 10.1109/TCAD.2005.860959
- ISSN
- 0278-0070
- eISSN
- 1937-4151
- Publisher
- IEEE
- Language
- English
- Date published
- 10/2006
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197203002771
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