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Hazard-Based Detection Conditions for Improved Transition Path Delay Fault Coverage
Journal article   Peer reviewed

Hazard-Based Detection Conditions for Improved Transition Path Delay Fault Coverage

Irith Pomeranz and Sudhakar M Reddy
IEEE transactions on computer-aided design of integrated circuits and systems, Vol.29(9), pp.1449-1453
09/2010
DOI: 10.1109/TCAD.2010.2049462

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Abstract

Benchmark testing Circuit faults Delay Delay defects DH-HEMTs Hazards Integrated circuit modeling Logic gates path delay faults test generation transition faults

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