Journal article
Improved n-Detection Test Sequences Under Transparent Scan
IEEE transactions on computer-aided design of integrated circuits and systems, Vol.25(11), pp.2492-2501
11/2006
DOI: 10.1109/TCAD.2006.881334
Abstract
The quality of test sequences for scan circuits under a test-application scheme called transparent scan as n-detection test sequences is studied. A transparent-scan sequence T is obtained from a compact single-detection combinational test set C. It is shown that for the same number of clock cycles required to apply C, the transparent-scan sequence T detects faults more times than C. It is also noted that a transparent-scan sequence based on a combinational test set contains unspecified values. The effects of specifying the unspecified values of the transparent-scan sequence on the quality of the sequence are studied by considering a random specification of these values. A procedure for modifying the scan-select subsequence of a (fully specified) transparent-scan sequence so as to improve its quality as an n-detection test sequence is also described. Finally, the extension of a transparent-scan test sequence into an n-detection test sequence that detects every target fault at least n times is considered. The results show a slower increase in test-application time with n than when combinational test sets are considered
Details
- Title: Subtitle
- Improved n-Detection Test Sequences Under Transparent Scan
- Creators
- Irith Pomeranz - Purdue University West LafayetteSudhakar M Reddy
- Resource Type
- Journal article
- Publication Details
- IEEE transactions on computer-aided design of integrated circuits and systems, Vol.25(11), pp.2492-2501
- DOI
- 10.1109/TCAD.2006.881334
- ISSN
- 0278-0070
- eISSN
- 1937-4151
- Publisher
- IEEE
- Language
- English
- Date published
- 11/2006
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197532502771
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