Journal article
Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations
IEEE transactions on very large scale integration (VLSI) systems, Vol.12(7), pp.780-788
2004
DOI: 10.1109/TVLSI.2004.830910
Abstract
Functional test sequences were shown to detect unique defects in VLSI circuits. This is thought to be due to the fact that they are applied at-speed. However, functional test sequences do not achieve complete stuck-at fault coverage. Therefore, scan-hased stuck-at tests, as well as other types of tests, are typically also applied. This increases the amount of test resources required for test application. We describe a procedure for inserting (limited) scan operations into a functional sequence in order to improve its stuck-at fault coverage, thus reducing or eliminating the need for separate scan-based stuck-at tests. Between scan operations, the functional test sequence can still be applied at-speed; however, a higher stuck-at fault coverage is achieved.
Details
- Title: Subtitle
- Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations
- Creators
- Irith Pomeranz - Purdue University West LafayetteSudhakar M Reddy - University of Iowa
- Resource Type
- Journal article
- Publication Details
- IEEE transactions on very large scale integration (VLSI) systems, Vol.12(7), pp.780-788
- DOI
- 10.1109/TVLSI.2004.830910
- ISSN
- 1063-8210
- eISSN
- 1557-9999
- Publisher
- Institute of Electrical and Electronics Engineers
- Language
- English
- Date published
- 2004
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197162002771
Metrics
13 Record Views