Journal article
Large-format X-Ray Reflection Grating Operated in an Echelle-like Mounting
The Astrophysical journal, Vol.897(1), p.92
07/01/2020
DOI: 10.3847/1538-4357/ab9a41
Abstract
We report on resolving power measurements of an X-ray reflection grating designed for use in an astronomical soft X-ray spectrograph. The grating was patterned via electron-beam lithography (EBL) to have fanned grooves to match the convergence of an illuminating beam. Grating measurements were conducted in an echelle-like mounting, which yields access to high diffraction orders in the soft X-ray bandpass (0.2-2.0 keV). By comparing the zeroth-order line-spread function to the telescope focus, we find evidence for minimal broadening (<1″) introduced by the figure of the grating. In addition, we fit for the spectral resolution (R = λ/Δλ) intrinsic to this grating using a Bayesian Markov Chain Monte Carlo approach. Using an ensemble fitting technique, we find that the grating resolution R exceeds 2200 (3 lower bound). This current grating resolution meets the performance required for a notional soft X-ray grating spectroscopy mission measuring hot baryonic material in the extended halos of galaxies. Using ray-trace simulations, we identify a geometric aberration resulting from path length differences across the width of the grating as a limiting factor in assessing the resolution of these gratings and discuss methods for placing better constraints on the inherent resolution of X-ray astronomical reflection gratings fabricated using EBL.
Details
- Title: Subtitle
- Large-format X-Ray Reflection Grating Operated in an Echelle-like Mounting
- Creators
- Casey T DeRoo - University of IowaRandall L McEntaffer - Pennsylvania State UniversityBenjamin D Donovan - Pennsylvania State UniversityFabien Grisé - Pennsylvania State UniversityChad Eichfeld - Pennsylvania State UniversityVadim Burwitz - Max Planck Institute for Extraterrestrial PhysicsGisela Hartner - Max Planck Institute for Extraterrestrial PhysicsCarlo Pelliciari - Max Planck Institute for Extraterrestrial PhysicsMarlis-Madeleine La Caria - Max Planck Institute for Extraterrestrial Physics
- Resource Type
- Journal article
- Publication Details
- The Astrophysical journal, Vol.897(1), p.92
- Publisher
- The American Astronomical Society
- DOI
- 10.3847/1538-4357/ab9a41
- ISSN
- 0004-637X
- eISSN
- 1538-4357
- Number of pages
- 15
- Grant note
- NNX17AD19G / NASA NNX17AC88G / NASA NNX15AC42G / NASA
- Alternative title
- Large-format X-Ray Reflection Grating Operated in an Echelle-like Mounting
- Language
- English
- Date published
- 07/01/2020
- Academic Unit
- Physics and Astronomy; University College Courses
- Record Identifier
- 9984428831802771
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