Journal article
Levy exponents as universal identifiers of threshold and criticality in random lasers
Physical review. A, Atomic, molecular, and optical physics, Vol.90(2), 025801
08/18/2014
DOI: 10.1103/PhysRevA.90.025801
Abstract
Critical excitation in random lasers under picosecond and nanosecond pumping was experimentally studied. The resulting emission intensity statistics were analyzed using fits to alpha-stable distributions. We find that the transition value of alpha, the tail exponent of the stable distribution, is a clear indicator of the threshold of random lasing. We discuss this exponent as an identifier of the threshold. This definition is compared with the conventional definitions for the threshold, namely, the probability of random lasing in the case of coherent random lasers and the intensity enhancement and bandwidth collapse for diffusive random lasing emission. We find a universal applicability of the alpha exponent as an identifier of the threshold, and hence the criticality, in random lasers.
Details
- Title: Subtitle
- Levy exponents as universal identifiers of threshold and criticality in random lasers
- Creators
- Ravitej Uppu - Tata Institute of Fundamental ResearchSushil Mujumdar - Tata Institute of Fundamental Research
- Resource Type
- Journal article
- Publication Details
- Physical review. A, Atomic, molecular, and optical physics, Vol.90(2), 025801
- Publisher
- Amer Physical Soc
- DOI
- 10.1103/PhysRevA.90.025801
- ISSN
- 1050-2947
- eISSN
- 1094-1622
- Number of pages
- 5
- Grant note
- XIIP0243 / Department of Atomic Energy, government of India; Department of Atomic Energy (DAE) DST; Department of Science & Technology (India)
- Language
- English
- Date published
- 08/18/2014
- Academic Unit
- Physics and Astronomy
- Record Identifier
- 9984442022202771
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