Journal article
Nonlinear emission dynamics from semiconductor microcavities in the nonperturbative regime
Solid state communications, Vol.104(5), pp.297-300
1997
DOI: 10.1016/S0038-1098(97)00279-2
Abstract
Time-resolved normal-mode-coupling (NMC) oscillations in the nonlinear regime of a semiconductor microcavity with a large splitting to linewidth ratio are studied experimentally using upconversion. A reduction of the modulation depth of the NMC oscillations and reflection dips without a change in the NMC splitting and oscillation period is observed. Microscopic calculations attribute the observed features to excitonic broadening due to dephasing induced by carrier-carrier and polarization scattering processes.
Details
- Title: Subtitle
- Nonlinear emission dynamics from semiconductor microcavities in the nonperturbative regime
- Creators
- O Lyngnes - University of ArizonaJ.D Berger - University of ArizonaJ.P Prineas - University of ArizonaS Park - University of ArizonaG Khitrova - University of ArizonaH.M Gibbs - University of ArizonaF Jahnke - Philipps University of MarburgM Kira - Philipps University of MarburgS.W Koch - Philipps University of Marburg
- Resource Type
- Journal article
- Publication Details
- Solid state communications, Vol.104(5), pp.297-300
- DOI
- 10.1016/S0038-1098(97)00279-2
- ISSN
- 0038-1098
- eISSN
- 1879-2766
- Publisher
- Elsevier Ltd
- Language
- English
- Date published
- 1997
- Academic Unit
- Physics and Astronomy
- Record Identifier
- 9984199706402771
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