Journal article
Observation of Radiation-Induced Leakage Current Defects in MOS Oxides With Multifrequency Electrically Detected Magnetic Resonance and Near-Zero-Field Magnetoresistance
IEEE transactions on nuclear science, Vol.67(1), pp.228-233
01/2020
DOI: 10.1109/TNS.2019.2958351
Abstract
We report high and low-frequency electrically detected magnetic resonance measurements and near-zero-field magnetoresistance measurements on radiation-induced leakage currents in irradiated Si/SiO 2 metal-oxide-silicon (MOS) structures. This study identifies the chemical and physical nature of atomic-scale defects involved in radiation-induced leakage currents in SiO 2 using an analytical technique. Our results suggest that trap-assisted tunneling through these Si/SiO 2 structures involves Pb centers (silicon dangling bonds at the Si/SiO 2 interface), rather than only E' centers (oxygen vacancies in the SiO 2 film). We utilize simulations of the defects' resonance spectra to provide further evidence for the involvement of interface Pb centers in the radiation-induced leakage currents. These simulations also explore the possibility of additional E' center involvement in the radiation-induced leakage currents.
Details
- Title: Subtitle
- Observation of Radiation-Induced Leakage Current Defects in MOS Oxides With Multifrequency Electrically Detected Magnetic Resonance and Near-Zero-Field Magnetoresistance
- Creators
- Stephen J. Moxim - Pennsylvania State UniversityJames P. Ashton - Pennsylvania State UniversityPatrick M. Lenahan - Pennsylvania State UniversityMichael E. Flatte - University of IowaNicholas J. Harmon - University of EvansvilleSean W. King - Intel
- Resource Type
- Journal article
- Publication Details
- IEEE transactions on nuclear science, Vol.67(1), pp.228-233
- Publisher
- IEEE
- DOI
- 10.1109/TNS.2019.2958351
- ISSN
- 0018-9499
- eISSN
- 1558-1578
- Grant note
- HDTRA1-18-0012; HDTRA1-16-0008 / Defense Threat Reduction Agency (10.13039/100000774)
- Language
- English
- Date published
- 01/2020
- Academic Unit
- Electrical and Computer Engineering; Physics and Astronomy
- Record Identifier
- 9984429041802771
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