Journal article
On Clustering of Undetectable Single Stuck-At Faults and Test Quality in Full-Scan Circuits
IEEE transactions on computer-aided design of integrated circuits and systems, Vol.29(7), pp.1135-1140
07/2010
DOI: 10.1109/TCAD.2010.2046448
Abstract
We demonstrate that undetectable single stuck-at faults in full-scan benchmark circuits tend to cluster in certain areas. This implies that certain areas may remain uncovered by a test set for single stuck-at faults. We describe an extension to the set of target faults aimed at providing a better coverage of the circuit in the presence of undetectable single stuck-at faults. The extended set of target faults consists of double stuck-at faults that include an undetectable fault as one of their components. The other component is a detectable fault adjacent to the undetectable fault. We present experimental results of fault simulation and test generation for the extended set of target faults.
Details
- Title: Subtitle
- On Clustering of Undetectable Single Stuck-At Faults and Test Quality in Full-Scan Circuits
- Creators
- Irith Pomeranz - Purdue University West LafayetteSudhakar M Reddy - University of Iowa
- Resource Type
- Journal article
- Publication Details
- IEEE transactions on computer-aided design of integrated circuits and systems, Vol.29(7), pp.1135-1140
- DOI
- 10.1109/TCAD.2010.2046448
- ISSN
- 0278-0070
- eISSN
- 1937-4151
- Publisher
- IEEE
- Language
- English
- Date published
- 07/2010
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197541602771
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