Journal article
On Functional Broadside Tests With Functional Propagation Conditions
IEEE transactions on very large scale integration (VLSI) systems, Vol.19(6), pp.1094-1098
2011
DOI: 10.1109/TVLSI.2010.2043695
Abstract
Functional broadside tests were defined as broadside tests where the scan-in state is a reachable state. This ensures that during the functional capture cycles of the test, the circuit visits states that it can also visit during functional operation. As a result, it avoids overtesting that may occur with unreachable states. However, the scan-out operation at the end of a functional broadside test allows the observation of any fault effects that reached the state variables at the end of the second capture cycle. As a result, a functional broadside test may detect faults that cannot affect functional operation (redundant faults). Addressing this issue completely requires full sequential test generation. We discuss an alternate solution that fits naturally with an existing process for generating functional broadside tests. © 2010 IEEE.
Details
- Title: Subtitle
- On Functional Broadside Tests With Functional Propagation Conditions
- Creators
- Irith Pomeranz - Purdue University West LafayetteSudhakar M Reddy - University of Iowa
- Resource Type
- Journal article
- Publication Details
- IEEE transactions on very large scale integration (VLSI) systems, Vol.19(6), pp.1094-1098
- DOI
- 10.1109/TVLSI.2010.2043695
- ISSN
- 1063-8210
- eISSN
- 1557-9999
- Publisher
- Institute of Electrical and Electronics Engineers
- Language
- English
- Date published
- 2011
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197177402771
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