Journal article
On finding a minimal functional description of a finite-state machine for test generation for adjacent machines
IEEE transactions on computers, Vol.49(1), pp.88-94
01/2000
DOI: 10.1109/12.822567
Abstract
In some applications, it is desirable to find for a circuit a minimal partial description that allows a certain task to be carried out. A partial circuit description allows the task to be carried out more efficiently since fewer decision points exist based on a partial description compared to the full circuit description. We consider this problem with respect to finite state machines and the following tasks. Starting from a functional description of a finite state machine M in the form of a state table ST, we select a minimal subset of state-transitions ST/sub part//spl sub/ST such that every output sequence that can be produced using state-transitions out of ST can also be produced using state-transitions out of ST/sub part/. We also formulate a similar problem related to the propagation of fault effects from the inputs to the outputs of M and describe a procedure for solving this problem. Applications of these tasks include test generation for circuits described as interconnections of finite-state machines. Experimental results presented show that ST/sub part/ contains a small fraction of the state-transitions of ST.
Details
- Title: Subtitle
- On finding a minimal functional description of a finite-state machine for test generation for adjacent machines
- Creators
- I Pomeranz - University of IowaS.M Reddy - University of Iowa
- Resource Type
- Journal article
- Publication Details
- IEEE transactions on computers, Vol.49(1), pp.88-94
- Publisher
- IEEE
- DOI
- 10.1109/12.822567
- ISSN
- 0018-9340
- eISSN
- 1557-9956
- Language
- English
- Date published
- 01/2000
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197347002771
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