Journal article
On n-detection test sets and variable n-detection test sets for transition faults
IEEE transactions on computer-aided design of integrated circuits and systems, Vol.19(3), pp.372-383
03/2000
DOI: 10.1109/43.833205
Abstract
We study the effectiveness of n-detection test sets based on transition faults in detecting defects that affect the timing behavior of a circuit. We use path delay faults as surrogates for unmodeled defects, and show that the path delay fault coverage achieved by an n-detection transition fault test set increases significantly as n is increased. We also introduce a method to reduce the number of tests included in an n-detection test set by using different values of n for different faults based on their potential effect on the defect coverage. The resulting test sets are referred to as variable n-detection test sets.
Details
- Title: Subtitle
- On n-detection test sets and variable n-detection test sets for transition faults
- Creators
- I Pomeranz - University of IowaS.M Reddy
- Resource Type
- Journal article
- Publication Details
- IEEE transactions on computer-aided design of integrated circuits and systems, Vol.19(3), pp.372-383
- Publisher
- IEEE
- DOI
- 10.1109/43.833205
- ISSN
- 0278-0070
- eISSN
- 1937-4151
- Language
- English
- Date published
- 03/2000
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197439102771
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