Journal article
On test data volume reduction for multiple scan chain designs
ACM transactions on design automation of electronic systems, Vol.8(4), pp.460-469
10/2003
DOI: 10.1145/944027.944031
Abstract
We consider issues related to the reduction of scan test data in designs with multiple scan chains. We propose a metric that can be used to evaluate the effectiveness of procedures for reducing the scan data volume. The metric compares the achieved compression to the compression which is intrinsic to the use of multiple scan chains. We also propose a procedure for modifying a given test set so as to achieve reductions in test data volume assuming a combinational decompressor circuit.
Details
- Title: Subtitle
- On test data volume reduction for multiple scan chain designs
- Creators
- Sudhakar M Reddy - University of IowaKohei Miyase - Kyushu Institute of TechnologySeiji Kajihara - Kyushu Institute of TechnologyIrith Pomeranz - Purdue University West Lafayette
- Resource Type
- Journal article
- Publication Details
- ACM transactions on design automation of electronic systems, Vol.8(4), pp.460-469
- DOI
- 10.1145/944027.944031
- ISSN
- 1084-4309
- eISSN
- 1557-7309
- Language
- English
- Date published
- 10/2003
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197237602771
Metrics
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