On the Detection of Terminal Stuck-Faults

Journal article

Peer reviewed

J G Kuhl and S M Reddy

IEEE transactions on computers, Vol.C-27(5), pp.467-469

05/1978

DOI: 10.1109/TC.1978.1675129

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Two lower bounds on the length of terminal stuck-fault tests and a technique to facilitate detection of terminal stuck-faults are given.

Lower bounds

stuck-at-faults

terminal stuck-faults

Title: Subtitle: On the Detection of Terminal Stuck-Faults
Creators: J G Kuhl - University of Iowa
S M Reddy
Resource Type: Journal article
Publication Details: IEEE transactions on computers, Vol.C-27(5), pp.467-469
Publisher: IEEE
DOI: 10.1109/TC.1978.1675129
ISSN: 0018-9340
eISSN: 1557-9956
Language: English
Date published: 05/1978
Academic Unit: Electrical and Computer Engineering; Public Policy Center (Archive)
Record Identifier: 9984197457702771

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