Journal article
On the Saturation of $n$-Detection Test Generation by Different Definitions With Increased $n
IEEE transactions on computer-aided design of integrated circuits and systems, Vol.27(5), pp.946-957
05/2008
DOI: 10.1109/TCAD.2008.917577
Abstract
An n-detection test set contains n different tests for each target fault. The value of n is typically determined based on test set size constraints, and certain values have become standard. Appropriate values for n are investigated in this paper by considering the saturation of the n -detection test generation process. As n is increased, eventually, the rate of increase in test set quality starts dropping. Saturation occurs when the increase in test set quality with n drops below a certain level. Three parameters of an n-detection test set are introduced to measure the saturation of the test generation process: 1) the fraction of faults detected n times or less by the test set; 2) the fraction of faults detected fewer than n times by the test set; and 3) the test set size relative to the size of a one-detection test set. It is demonstrated that the behavior of each one of these parameters follows a unique pattern as n is increased, and certain features of this behavior can be used to identify saturation. All the parameters can be efficiently computed during the test generation process. © 2006 IEEE.
Details
- Title: Subtitle
- On the Saturation of $n$-Detection Test Generation by Different Definitions With Increased $n
- Creators
- Irith Pomeranz - Purdue University West LafayetteSudhakar M Reddy - University of Iowa
- Resource Type
- Journal article
- Publication Details
- IEEE transactions on computer-aided design of integrated circuits and systems, Vol.27(5), pp.946-957
- DOI
- 10.1109/TCAD.2008.917577
- ISSN
- 0278-0070
- eISSN
- 1937-4151
- Language
- English
- Date published
- 05/2008
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197115302771
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