On the characterization and efficient computation of hard-to-detect bridging faults

Irith Pomeranz; Sudhakar M Reddy; Sandip Kundu

doi:10.1109/TCAD.2004.837725

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On the characterization and efficient computation of hard-to-detect bridging faults

Journal article

Peer reviewed

On the characterization and efficient computation of hard-to-detect bridging faults

Irith Pomeranz, Sudhakar M Reddy and Sandip Kundu

IEEE transactions on computer-aided design of integrated circuits and systems, Vol.23(12), pp.1640-1649

12/2004

DOI: 10.1109/TCAD.2004.837725

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Abstract

We investigate a characterization of hard-to-detect bridging faults. For circuits with large numbers of lines (or nodes), this characterization can be used to select target faults for test generation efficiently, when it is impractical to target all the bridging faults (or all the realistic bridging faults). We demonstrate that the faults selected based on the proposed characterization are indeed hard-to-detect by performing the following experiments. 1) We show that the fault coverage of a given test set, with respect to the selected subset of bridging faults, is lower and more sensitive to the test set than the fault coverage obtained with respect to a random subset of bridging faults of the same size, with respect to the complete set of bridging faults, and when possible, with respect to a subset of realistic bridging faults of the same size. 2) We demonstrate that a test set generated for the selected subset of bridging faults detects other bridging faults more effectively than when a test set is derived for a randomly selected subset of bridging faults of the same size. We also describe an efficient procedure for selecting hard-to-detect bridging faults according to the proposed characterization. This procedure avoids enumeration of all the faults in order to select the hard-to-detect ones. This is important for large circuits where even enumeration of all the bridging faults may not be feasible.

Bridge circuits

Bridging faults

Character generation

Circuit faults

Circuit simulation

Circuit testing

Design automation

Fault detection

Fault diagnosis

fault selection

fault simulation

hard-to-detect faults

Performance evaluation

test generation

Details

Title: Subtitle: On the characterization and efficient computation of hard-to-detect bridging faults
Creators: Irith Pomeranz - Purdue University West Lafayette
Sudhakar M Reddy - University of Iowa
Sandip Kundu - Intel
Resource Type: Journal article
Publication Details: IEEE transactions on computer-aided design of integrated circuits and systems, Vol.23(12), pp.1640-1649
DOI: 10.1109/TCAD.2004.837725
ISSN: 0278-0070
eISSN: 1937-4151
Publisher: IEEE
Language: English
Date published: 12/2004
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984198005902771

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