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On the effectiveness of residue code checking for parallel two's complement multipliers
Journal article   Peer reviewed

On the effectiveness of residue code checking for parallel two's complement multipliers

U Sparmann and S. M Reddy
IEEE transactions on very large scale integration (VLSI) systems, Vol.4(2), pp.227-239
1996
DOI: 10.1109/92.502194

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Abstract

Applied Sciences Integrated Circuits Design. Technologies. Operation analysis. Testing Electronics Exact sciences and technology Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices

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