Sign in
Patterning by Etching at the Nanoscale (PENs) on Si(111) through the Controlled Etching of PDMS
Journal article   Peer reviewed

Patterning by Etching at the Nanoscale (PENs) on Si(111) through the Controlled Etching of PDMS

Mathew Perring, Michael Mitchell, Paul J. A Kenis and Ned B Bowden
Chemistry of materials, Vol.19(11), pp.2903-2909
05/29/2007
DOI: 10.1021/cm062988n

View Online

Abstract

Details

Metrics