Physical, Chemical and Hygroscopic Properties of Submicrometer Particles Studied using X-ray Spectro-Microscopy and Atomic Force Microscopy

Journal article

Peer reviewed

A.V Tivanski

Microscopy and microanalysis, Vol.18(S2), pp.848-849

07/2012

DOI: 10.1017/S1431927612006095

PMID: 23191369

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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Correlative Microscopy and Chemical Imaging-02

Instrumentation Symposium

Title: Subtitle: Physical, Chemical and Hygroscopic Properties of Submicrometer Particles Studied using X-ray Spectro-Microscopy and Atomic Force Microscopy
Creators: A.V Tivanski - 1University of Iowa, Iowa City, IA
Resource Type: Journal article
Publication Details: Microscopy and microanalysis, Vol.18(S2), pp.848-849
Publisher: Cambridge University Press
DOI: 10.1017/S1431927612006095
PMID: 23191369
ISSN: 1431-9276
eISSN: 1435-8115
Number of pages: 2
Language: English
Date published: 07/2012
Academic Unit: Chemistry
Record Identifier: 9984216689602771

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