Journal article
Pressure-Induced Restructuring of a Monolayer Film Nanojunction Produces Threshold and Power Law Conduction
Langmuir, Vol.24(6), pp.2288-2293
03/18/2008
DOI: 10.1021/la7032498
PMID: 18278960
Abstract
The electrical conduction of metal-molecule-metal junctions formed between Au-supported self-assembled monolayers of structurally different 1-hexanethiol, 1-decanethiol, and ferrocenyl-1-undecanethiol and a Pt-coated atomic force microscope (AFM) tip has been measured under different compression forces using conducting-probe AFM. The observed junction resistance had two distinct power law scaling changes with the compression force. Different scaling regions were assigned to the change in the contact area, tunneling distance, number of conduction pathways, and structure of the film under compression. © 2008 American Chemical Society.
Details
- Title: Subtitle
- Pressure-Induced Restructuring of a Monolayer Film Nanojunction Produces Threshold and Power Law Conduction
- Creators
- Alexei V Tivanski - Department of Chemistry, University of Iowa, Iowa City, Iowa 52242, and Department of Chemistry,University of Toronto, Toronto, Ontario, Canada M5S 3H6James K LI - Department of Chemistry, University of Iowa, Iowa City, Iowa 52242, and Department of Chemistry,University of Toronto, Toronto, Ontario, Canada M5S 3H6Gilbert C Walker - Department of Chemistry, University of Iowa, Iowa City, Iowa 52242, and Department of Chemistry,University of Toronto, Toronto, Ontario, Canada M5S 3H6
- Resource Type
- Journal article
- Publication Details
- Langmuir, Vol.24(6), pp.2288-2293
- Publisher
- American Chemical Society
- DOI
- 10.1021/la7032498
- PMID
- 18278960
- ISSN
- 0743-7463
- eISSN
- 1520-5827
- Language
- English
- Date published
- 03/18/2008
- Academic Unit
- Chemistry
- Record Identifier
- 9984216726602771
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