Journal article
Reducing the Storage Requirements of a Test Sequence by Using One or Two Background Vectors
IEEE transactions on very large scale integration (VLSI) systems, Vol.19(10), pp.1755-1764
2011
DOI: 10.1109/TVLSI.2010.2055588
Abstract
We describe a storage scheme for functional test sequences where a test sequence T is associated with a primary input vector B called a background vector. T is stored by storing only the differences between its test vectors and B. We describe a procedure for computing a background vector B for a given test sequence T. We also describe a procedure that modifies T so as to reduce its storage requirements with respect to B. We present experimental results demonstrating that the single background vector B, computed based on T, allows T to be modified such that a vast majority of its entries are equal to the corresponding entries of B. Consequently, storage of T reduces to storage of a small number of entries. We also extend the discussion to storage of T based on two background vectors. A second background vector provides more flexibility in storing T as a list of entries where it is different from its background vectors. This contributes to a further reduction in storage requirements for certain circuits. © 2010 IEEE.
Details
- Title: Subtitle
- Reducing the Storage Requirements of a Test Sequence by Using One or Two Background Vectors
- Creators
- Irith Pomeranz - Purdue University West LafayetteSudhakar M Reddy - University of Iowa
- Resource Type
- Journal article
- Publication Details
- IEEE transactions on very large scale integration (VLSI) systems, Vol.19(10), pp.1755-1764
- DOI
- 10.1109/TVLSI.2010.2055588
- ISSN
- 1063-8210
- eISSN
- 1557-9999
- Publisher
- Institute of Electrical and Electronics Engineers
- Language
- English
- Date published
- 2011
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984196969902771
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