Journal article
Reducing the number of specified values per test vector by increasing the test set size
IEE proceedings. Computers and digital techniques, Vol.153(1), pp.39-46
2006
DOI: 10.1049/ip-cdt:20050129
Abstract
Test sets consisting of incompletely specified test vectors for full-scan circuits have applications in input test data compression and power reduction. Earlier procedures for reducing the percentage of specified values in a given test set maintained the test set size. A procedure is described that starts from a given (compact) test set and reduces the percentage of specified values by replacing a selected test vector with a subset of test vectors that have fewer specified values per test vector and together detect the same subset of faults. By applying this replacement process iteratively, the procedure provides a series of solutions with increasing test set sizes and decreasing numbers of specified values per test vector. The importance of considering a series of solutions is demonstrated in the application of input test data compression.
Details
- Title: Subtitle
- Reducing the number of specified values per test vector by increasing the test set size
- Creators
- I Pomeranz - Purdue University West LafayetteS. M Reddy - University of Iowa
- Resource Type
- Journal article
- Publication Details
- IEE proceedings. Computers and digital techniques, Vol.153(1), pp.39-46
- DOI
- 10.1049/ip-cdt:20050129
- ISSN
- 1350-2387
- eISSN
- 1359-7027
- Publisher
- Institution of Electrical Engineers
- Language
- English
- Date published
- 2006
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197416002771
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