Journal article
Resolution of Diagnosis Based on Transition Faults
IEEE transactions on very large scale integration (VLSI) systems, Vol.20(1), pp.172-176
2012
DOI: 10.1109/TVLSI.2010.2091975
Abstract
The conventional detection conditions for transition faults do not predict fault effects that may be created when transition faults are activated and/or propagated by pulses (or hazards). For this, detection conditions that take hazards into consideration need to be used. However, since the occurrence of pulses cannot be predicted accurately based on a gate-level circuit description, the transition fault model becomes more susceptible to pattern-dependent effects, where errors on observed outputs that are predicted by the fault model may not appear in a circuit-under-diagnosis. This paper considers the implications of these pattern-dependent effects on the resolution of fault diagnosis based on transition faults. © 2006 IEEE.
Details
- Title: Subtitle
- Resolution of Diagnosis Based on Transition Faults
- Creators
- Irith Pomeranz - Purdue University West LafayetteSudhakar M Reddy - University of Iowa
- Resource Type
- Journal article
- Publication Details
- IEEE transactions on very large scale integration (VLSI) systems, Vol.20(1), pp.172-176
- DOI
- 10.1109/TVLSI.2010.2091975
- ISSN
- 1063-8210
- eISSN
- 1557-9999
- Publisher
- Institute of Electrical and Electronics Engineers
- Language
- English
- Date published
- 2012
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197221102771
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