Journal article
Scan-Based Tests with Low Switching Activity
IEEE design & test of computers, Vol.24(3), pp.268-275
05/2007
DOI: 10.1109/MDT.2007.80
Abstract
Supply current and power dissipation during scan-based test can be far higher than during normal circuit operation, owing to excessive switching activity caused by the tests. Excessive switching activity can occur during scan shift and test response capture. Higher peak-current demands can cause supply voltage droops, making good chips fail at-speed tests. Higher average switching activity causes higher power dissipation and chip temperature, which in turn can cause hot spots and damage circuits under test. This article investigates a method to derive tests with reduced switching activity during scan shift and test response capture. The method does not require additional hardware or modifications to the scan chains. The authors present experimental results on benchmark and industrial circuits. © 2007 IEEE.
Details
- Title: Subtitle
- Scan-Based Tests with Low Switching Activity
- Creators
- Santiago Remersaro - University of IowaXijiang Lin - Mentor Graphics (United States)Sudhakar M Reddy - University of IowaIrith Pomeranz - Purdue University West LafayetteJanusz Rajski - Mentor Graphics (United States)
- Resource Type
- Journal article
- Publication Details
- IEEE design & test of computers, Vol.24(3), pp.268-275
- DOI
- 10.1109/MDT.2007.80
- ISSN
- 0740-7475
- eISSN
- 1558-1918
- Language
- English
- Date published
- 05/2007
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197551002771
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