Journal article
Scan Design Using Standard Flip-Flops
IEEE design & test of computers, Vol.4(1), pp.52-54
02/1987
DOI: 10.1109/MDT.1987.295115
Abstract
Classical scan designs require properly augmented flip-flops, often called scan flip-flops. Problems stem from the high area overhead implied by the need for these flip-flops or the inability to modify standard flip-flops. The authors outline a method to design easily testable sequential circuits that achieve scan designs using standard (unmodified) flip-flops.
Details
- Title: Subtitle
- Scan Design Using Standard Flip-Flops
- Creators
- Sudhakar M Reddy - University of IowaR Dandapani - University of Colorado Boulder
- Resource Type
- Journal article
- Publication Details
- IEEE design & test of computers, Vol.4(1), pp.52-54
- Publisher
- IEEE Computer Society
- DOI
- 10.1109/MDT.1987.295115
- ISSN
- 0740-7475
- eISSN
- 1558-1918
- Language
- English
- Date published
- 02/1987
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197446202771
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