Journal article
Selection of a Fault Model for Fault Diagnosis Based on Unique Responses
IEEE transactions on very large scale integration (VLSI) systems, Vol.18(11), pp.1533-1543
11/2010
DOI: 10.1109/TVLSI.2009.2025503
Abstract
In this paper, we describe a preprocessing step to fault diagnosis of an observed response obtained from a faulty chip. In this step, a fault model for diagnosing the observed response is selected. This step allows fault diagnosis to be performed based on a single fault model after identifying the most appropriate one. We describe a specific implementation of this preprocessing step based on what is referred to as the unique output response of a fault model. As an example, we apply it to the diagnosis of multiple stuck-at faults, selecting between single and double stuck-at faults as the fault model for diagnosis. Experimental results demonstrate improvements compared to diagnosis based on single stuck-at faults, and compared to diagnosis based on both single and double stuck-at faults. We also discuss the use of a subset of double stuck-at faults for diagnosis, and the application of the proposed preprocessing step with other fault models.
Details
- Title: Subtitle
- Selection of a Fault Model for Fault Diagnosis Based on Unique Responses
- Creators
- Irith Pomeranz - Purdue University West LafayetteSudhakar M Reddy - University of Iowa
- Resource Type
- Journal article
- Publication Details
- IEEE transactions on very large scale integration (VLSI) systems, Vol.18(11), pp.1533-1543
- DOI
- 10.1109/TVLSI.2009.2025503
- ISSN
- 1063-8210
- eISSN
- 1557-9999
- Publisher
- IEEE
- Language
- English
- Date published
- 11/2010
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197443602771
Metrics
9 Record Views