Single Particle Atomic Force Microscopy

Alexei Tivanski

doi:10.1017/S1431927620023910

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Journal article

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Peer reviewed

Single Particle Atomic Force Microscopy

Alexei Tivanski

Microscopy and Microanalysis, Vol.26(S2), pp.3132-3132

08/2020

DOI: 10.1017/S1431927620023910

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Abstract

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Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Frontiers in Spectroscopy and Microscopy Part I - Doping and Mobility

Details

Title: Subtitle: Single Particle Atomic Force Microscopy
Creators: Alexei Tivanski - University of Iowa, Iowa City, Iowa, United States
Resource Type: Journal article
Publication Details: Microscopy and Microanalysis, Vol.26(S2), pp.3132-3132
Publisher: Cambridge University Press
DOI: 10.1017/S1431927620023910
ISSN: 1431-9276
eISSN: 1435-8115
Number of pages: 1
Language: English
Date published: 08/2020
Academic Unit: Chemistry
Record Identifier: 9984216725602771

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