Journal article
Sizes of test sets for path delay faults using strong and weak non-robust tests
IET computers & digital techniques, Vol.5(5), pp.405-414
2011
DOI: 10.1049/iet-cdt.2010.0049
Abstract
The trade-off between strong and weak non-robust tests for path delay faults considering test quality, test set size and fault coverage is discussed. It is noted that strong non-robust tests detect more combinations of delay defects. However, weak non-robust tests result in smaller test sets, and more path delay faults are detectable by weak non-robust tests. A test generation strategy that mixes strong and weak non-robust tests based on this trade-off is described. Under the proposed strategy, test generation starts by generating strong non-robust tests. When the number of faults detected by each additional test drops below a certain level, indicating that low levels of compaction are achieved, test generation switches to weak non-robust tests. The authors study appropriate switching points experimentally by using a test selection procedure to construct mixed test sets. They also consider the effects of adding power constraints on the mix of strong and weak non-robust tests.
Details
- Title: Subtitle
- Sizes of test sets for path delay faults using strong and weak non-robust tests
- Creators
- I Pomeranz - Purdue University West LafayetteS. M Reddy - University of Iowa
- Resource Type
- Journal article
- Publication Details
- IET computers & digital techniques, Vol.5(5), pp.405-414
- DOI
- 10.1049/iet-cdt.2010.0049
- ISSN
- 1751-8601
- eISSN
- 1751-861X
- Publisher
- Institution of Engineering and Technology
- Language
- English
- Date published
- 2011
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197272702771
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