Soft X-ray quantum efficiency of a commercial CMOS imaging sensor

Colin M. Packard; Steve Tammes; Philip Kaaret; Casey DeRoo; Jessica L. McChesney; John W. Freeland; Fanny Rodolakis

doi:10.1117/1.JATIS.10.3.036001

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Soft X-ray quantum efficiency of a commercial CMOS imaging sensor

Journal article

Peer reviewed

Soft X-ray quantum efficiency of a commercial CMOS imaging sensor

Colin M. Packard, Steve Tammes, Philip Kaaret, Casey DeRoo, Jessica L. McChesney, John W. Freeland and Fanny Rodolakis

Journal of astronomical telescopes, instruments, and systems, Vol.10(3), 036001

08/10/2024

DOI: 10.1117/1.JATIS.10.3.036001

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https://www.osti.gov/biblio/2565008View

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Abstract

The demonstrated performance and cost-effectiveness of complementary metal–oxide–semiconductor (CMOS) sensors make them a potentially attractive option for low-cost space-based X-ray observatories. We have previously reported on the performance of a commercially available backside-illuminated Sony IMX290LLR-C CMOS sensor and found it to offer X-ray spectral resolutions comparable to the charged coupled devices (CCDs) aboard Suzaku and Chandra and to have a sufficient radiation hardness for use in low Earth orbit. In this work, we report on the quantum efficiency (QE) of this sensor, an essential metric for modeling the sensitivity of an instrument as an X-ray detector. Using the Advanced Photon Source at Argonne National Laboratory, we measure the soft X-ray QE of this CMOS sensor to be 0.28±0.02 at a photon energy of 490.5 eV. This energy was chosen for its proximity to the astrophysically important O VII triplet emission lines (∼574eV) studied by the HaloSat mission. Although not surpassing that of the back-illuminated CCDs aboard Suzaku and Chandra, this QE compares favorably to that of the front-illuminated CCDs aboard the same observatories and is competitive with that of the silicon drift detectors used aboard HaloSat, making it a strong candidate for use on future X-ray small satellite (SmallSat) missions.

complementary metal-oxide-semiconductor image sensor

X-ray spectroscopy

X-ray imaging

backside-illuminated

sensor performance

soft X-ray

quantum efficiency

silicon

Details

Title: Subtitle: Soft X-ray quantum efficiency of a commercial CMOS imaging sensor
Creators: Colin M. Packard - University of Iowa
Steve Tammes - University of Iowa
Philip Kaaret - University of Iowa
Casey DeRoo - University of Iowa
Jessica L. McChesney - Argonne National Laboratory
John W. Freeland - Argonne National Laboratory
Fanny Rodolakis - Argonne National Laboratory
Resource Type: Journal article
Publication Details: Journal of astronomical telescopes, instruments, and systems, Vol.10(3), 036001
DOI: 10.1117/1.JATIS.10.3.036001
ISSN: 2329-4124
eISSN: 2329-4221
Publisher: SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS
Grant note: NASA EPSCoR: NH23ZHA002C U.S. DOE Office of Science-Basic Energy Sciences: DE-AC02-06CH11357
This work was supported by NASA grant 80NSSC20K0398 and NASA EPSCoR award NH23ZHA002C. C.M.P.'s efforts were partially supported by the University of Iowa's Graduate College. This research used resources of the Advanced Photon Source, a U.S. Department of Energy (DOE) Office of Science User Facility at Argonne National Laboratory and is based on research supported by the U.S. DOE Office of Science-Basic Energy Sciences, under Contract No. DE-AC02-06CH11357.
Language: English
Date published: 08/10/2024
Academic Unit: Physics and Astronomy; University College Courses
Record Identifier: 9984696863102771

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