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Structure of nanocrystalline GaN from X-ray diffraction, Rietveld and atomic pair distribution function analyses
Journal article   Peer reviewed

Structure of nanocrystalline GaN from X-ray diffraction, Rietveld and atomic pair distribution function analyses

V Petkov, M Gateshki, J Choi, E. G Gillan and Y Ren
Journal of Materials Chemistry, Vol.15(43), pp.4654-4659
10/31/2005
DOI: 10.1039/b509577h

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