Journal article
Switching Activity as a Test Compaction Heuristic for Transition Faults
IEEE transactions on very large scale integration (VLSI) systems, Vol.18(9), pp.1357-1361
09/2010
DOI: 10.1109/TVLSI.2009.2022474
Abstract
The switching activity of scan-based tests for delay faults is considered as a test compaction heuristic. Two test compaction processes based on the switching activity are described. The results of several experiments are presented where test sets consisting of tests with different switching activity are compared based on their size as well as coverage of untargeted faults. The results demonstrate that test sets where the tests have higher switching activity are smaller. Their untargeted fault coverage is comparable, and sometimes even higher, than that of larger test sets for the same target faults. To avoid overtesting due to high switching activity it is possible to consider functional broadside tests. For other types of tests it is possible to bound the switching activity such that it would not exceed that possible during functional operation. © 2009 IEEE.
Details
- Title: Subtitle
- Switching Activity as a Test Compaction Heuristic for Transition Faults
- Creators
- Irith Pomeranz - Purdue University West LafayetteSudhakar M Reddy - University of Iowa
- Resource Type
- Journal article
- Publication Details
- IEEE transactions on very large scale integration (VLSI) systems, Vol.18(9), pp.1357-1361
- DOI
- 10.1109/TVLSI.2009.2022474
- ISSN
- 1063-8210
- eISSN
- 1557-9999
- Language
- English
- Date published
- 09/2010
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197544502771
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